GRADUATE SCHOOL

Mechanical Engineering Master's Program with Thesis (English)

ME 525 | Course Introduction and Application Information

Course Name
Characterization Techniques for Nanomaterials
Code
Semester
Theory
(hour/week)
Application/Lab
(hour/week)
Local Credits
ECTS
ME 525
Fall/Spring
3
0
3
7.5

Prerequisites
None
Course Language
English
Course Type
Elective
Course Level
Second Cycle
Mode of Delivery -
Teaching Methods and Techniques of the Course Lecture / Presentation
Course Coordinator
Course Lecturer(s)
Assistant(s) -
Course Objectives The aim of this course is to provide students a strong background on characterization techniques for nanomaterials, to introduce microscopy techniques, to explain spectroscopy techniques used in nanotechnology.
Learning Outcomes The students who succeeded in this course;
  • describe techniques used for morphological characterization
  • explain the underlying principles for the composition analysis of nanomaterials
  • interpret the working principles Scanning Electron Microscopy and Transmission Emission Microscopy
  • describe the working principles and process steps of Atomic Force Microscopy
  • determine the techniques used for investigating the magnetic and thermal properties of nanomaterials
Course Description This course covers principles of analytical techniques used for the characterization of nanomaterials, surface analysis techniques, UV-Vis spectroscopy, crystallographic characterization by XRD, investigation of thermal properties using TGA and DSC, structural characterization by AFM, SEM and TEM

 



Course Category

Core Courses
Major Area Courses
X
Supportive Courses
Media and Management Skills Courses
Transferable Skill Courses

 

WEEKLY SUBJECTS AND RELATED PREPARATION STUDIES

Week Subjects Related Preparation
1 General principles of analytical techniques Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008 Chapter 1
2 Fundamentals of Atomic Force Microscopy Zang-Li-Kumar, Chapter 4
3 Modes of Atomic Force Microscopy Zang-Li-Kumar, Chapter 4
4 General principles of Scanning Electron Microscopy Zang-Li-Kumar, Chapter 7
5 General principles of Scanning Electron Microscopy Zang-Li-Kumar, Chapter 7
6 General principles of Transmission Emission Microscopy Zang-Li-Kumar, Chapter 6
7 General principles of Transmission Emission Microscopy Zang-Li-Kumar, Chapter 6
8 Midterm Exam
9 Fundamentals of FTIR Spectroscopy Zang-Li-Kumar, Chapter 9
10 Fundamentals of UV-Visible spectroscopy Zang-Li-Kumar, Chapter 9
11 Fundamentals of X-ray Diffraction analysis Zang-Li-Kumar, Chapter 5
12 Differential scanning calorimetry Zang-Li-Kumar, Chapter 10
13 Thermogravimetric analysis Zang-Li-Kumar, Chapter 10
14 Review of the term
15 Review of the term
16 Final Exam

 

Course Notes/Textbooks

Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008

Suggested Readings/Materials

Scanning Microscopy For Nanotechnology: Techniques And Applications,

Weilie Zhou and Zhong Lin Wang, Springer Verlag, 2008

 Recent articles published in peer-reviewed journals

 

EVALUATION SYSTEM

Semester Activities Number Weigthing
Participation
Laboratory / Application
Field Work
Quizzes / Studio Critiques
Portfolio
Homework / Assignments
1
15
Presentation / Jury
3
15
Project
Seminar / Workshop
Oral Exams
Midterm
1
30
Final Exam
1
40
Total

Weighting of Semester Activities on the Final Grade
5
60
Weighting of End-of-Semester Activities on the Final Grade
1
40
Total

ECTS / WORKLOAD TABLE

Semester Activities Number Duration (Hours) Workload
Theoretical Course Hours
(Including exam week: 16 x total hours)
16
3
48
Laboratory / Application Hours
(Including exam week: '.16.' x total hours)
16
0
Study Hours Out of Class
14
3
42
Field Work
0
Quizzes / Studio Critiques
0
Portfolio
0
Homework / Assignments
3
10
30
Presentation / Jury
3
10
30
Project
0
Seminar / Workshop
0
Oral Exam
0
Midterms
1
30
30
Final Exam
1
45
45
    Total
225

 

COURSE LEARNING OUTCOMES AND PROGRAM QUALIFICATIONS RELATIONSHIP

#
Program Competencies/Outcomes
* Contribution Level
1
2
3
4
5

*1 Lowest, 2 Low, 3 Average, 4 High, 5 Highest

 


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