GRADUATE SCHOOL
Mechanical Engineering Master's Program with Thesis (English)
ME 525 | Course Introduction and Application Information
Course Name |
Characterization Techniques for Nanomaterials
|
Code
|
Semester
|
Theory
(hour/week) |
Application/Lab
(hour/week) |
Local Credits
|
ECTS
|
ME 525
|
Fall/Spring
|
3
|
0
|
3
|
7.5
|
Prerequisites |
None
|
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Course Language |
English
|
|||||
Course Type |
Elective
|
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Course Level |
Second Cycle
|
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Mode of Delivery | - | |||||
Teaching Methods and Techniques of the Course | Lecture / Presentation | |||||
Course Coordinator | ||||||
Course Lecturer(s) | ||||||
Assistant(s) | - |
Course Objectives | The aim of this course is to provide students a strong background on characterization techniques for nanomaterials, to introduce microscopy techniques, to explain spectroscopy techniques used in nanotechnology. |
Learning Outcomes |
The students who succeeded in this course;
|
Course Description | This course covers principles of analytical techniques used for the characterization of nanomaterials, surface analysis techniques, UV-Vis spectroscopy, crystallographic characterization by XRD, investigation of thermal properties using TGA and DSC, structural characterization by AFM, SEM and TEM |
|
Core Courses | |
Major Area Courses |
X
|
|
Supportive Courses | ||
Media and Management Skills Courses | ||
Transferable Skill Courses |
WEEKLY SUBJECTS AND RELATED PREPARATION STUDIES
Week | Subjects | Related Preparation |
1 | General principles of analytical techniques | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008 Chapter 1 |
2 | Fundamentals of Atomic Force Microscopy | Zang-Li-Kumar, Chapter 4 |
3 | Modes of Atomic Force Microscopy | Zang-Li-Kumar, Chapter 4 |
4 | General principles of Scanning Electron Microscopy | Zang-Li-Kumar, Chapter 7 |
5 | General principles of Scanning Electron Microscopy | Zang-Li-Kumar, Chapter 7 |
6 | General principles of Transmission Emission Microscopy | Zang-Li-Kumar, Chapter 6 |
7 | General principles of Transmission Emission Microscopy | Zang-Li-Kumar, Chapter 6 |
8 | Midterm Exam | |
9 | Fundamentals of FTIR Spectroscopy | Zang-Li-Kumar, Chapter 9 |
10 | Fundamentals of UV-Visible spectroscopy | Zang-Li-Kumar, Chapter 9 |
11 | Fundamentals of X-ray Diffraction analysis | Zang-Li-Kumar, Chapter 5 |
12 | Differential scanning calorimetry | Zang-Li-Kumar, Chapter 10 |
13 | Thermogravimetric analysis | Zang-Li-Kumar, Chapter 10 |
14 | Review of the term | |
15 | Review of the term | |
16 | Final Exam |
Course Notes/Textbooks | Materials Characterization Techniques, Sam Zhang, Lin Li, Ashok Kumar, CRC Press, 2008 |
Suggested Readings/Materials | Scanning Microscopy For Nanotechnology: Techniques And Applications, Weilie Zhou and Zhong Lin Wang, Springer Verlag, 2008 Recent articles published in peer-reviewed journals |
EVALUATION SYSTEM
Semester Activities | Number | Weigthing |
Participation | ||
Laboratory / Application | ||
Field Work | ||
Quizzes / Studio Critiques | ||
Portfolio | ||
Homework / Assignments |
1
|
15
|
Presentation / Jury |
3
|
15
|
Project | ||
Seminar / Workshop | ||
Oral Exams | ||
Midterm |
1
|
30
|
Final Exam |
1
|
40
|
Total |
Weighting of Semester Activities on the Final Grade |
5
|
60
|
Weighting of End-of-Semester Activities on the Final Grade |
1
|
40
|
Total |
ECTS / WORKLOAD TABLE
Semester Activities | Number | Duration (Hours) | Workload |
---|---|---|---|
Theoretical Course Hours (Including exam week: 16 x total hours) |
16
|
3
|
48
|
Laboratory / Application Hours (Including exam week: '.16.' x total hours) |
16
|
0
|
|
Study Hours Out of Class |
14
|
3
|
42
|
Field Work |
0
|
||
Quizzes / Studio Critiques |
0
|
||
Portfolio |
0
|
||
Homework / Assignments |
3
|
10
|
30
|
Presentation / Jury |
3
|
10
|
30
|
Project |
0
|
||
Seminar / Workshop |
0
|
||
Oral Exam |
0
|
||
Midterms |
1
|
30
|
30
|
Final Exam |
1
|
45
|
45
|
Total |
225
|
COURSE LEARNING OUTCOMES AND PROGRAM QUALIFICATIONS RELATIONSHIP
#
|
Program Competencies/Outcomes |
* Contribution Level
|
||||
1
|
2
|
3
|
4
|
5
|
*1 Lowest, 2 Low, 3 Average, 4 High, 5 Highest